Charged particle beam extraction system and method
- 申请公布号：
- US7385203(B2)
- 申请号：
- US20050146074
- 申请日期：
- 2005.06.07
- 申请公布日期：
- 2008.06.10
- 申请人：
- HITACHI, LTD.
- 发明人：
- NAKAYAMA TAKAHIDE;NATORI TAKAYOSHI;YANAGISAWA MASAKI
- 分类号：
- G01K1/08;H01J3/14;H01J3/26
- 主分类号：
- G01K1/08
- 摘要：
- A charged particle beam extraction system and method capable of ensuring higher safety when extraction of an ion beam is on/off-controlled during irradiation of the ion beam for treatment. The charged particle beam extraction system comprises a charged particle beam generator including a synchrotron, a range modulation wheel (RMW) for forming a Bragg peak width of a charged particle beam extracted from the charged particle beam generator, a gate signal generator for controlling start and stop of extraction of the charged particle beam from the charged particle beam generator in accordance with a rotational angle of the RMW, and an irradiation control/determination section for determining whether the start and stop of extraction of the charged particle beam is controlled at desired timing by the gate signal generator.
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