MEMORY ARRAY REPAIR WHERE REPAIR LOGIC CANNOT OPERATE AT SAME OPERATING CONDITION AS ARRAY

申请公布号:
US2008209256(A1)
申请号:
US20080116345
申请日期:
2008.05.07
申请公布日期:
2008.08.28
申请人:
CORBIN WILLIAM R J
发明人:
CORBIN WILLIAM R. J.
分类号:
G06F11/07
主分类号:
G06F11/07
摘要:
Memory array repair where the repair logic cannot operate at the same operating condition as the memory array is disclosed. In one embodiment, a test is run with the memory array configured in a first operating condition that repair logic for the memory array cannot achieve, and test data is accumulated from the test in the memory array. The memory array is then read with the memory array configured in a second operating condition that the repair logic can achieve using the test data from the test at the first operating condition. As a result, repairs can be achieved even though the repair logic is incapable of operating at the same condition as the memory array. A method, test unit and integrated circuit implementing the testing are disclosed.
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