Simulated battery logic testing device

申请公布号：

US7542858(B2)

申请号：

US20050145366

申请日期：

2005.06.03

申请公布日期：

2009.06.02

申请人：

LSI CORPORATION

发明人：

HORNING RANDALL F.;TANG EDDE TIN SHEK;FAFACH, JR. DEL

分类号：

G01R31/36;G06F19/00

主分类号：

G01R31/36

摘要：

A simulated battery test device and method that is capable of testing a battery charging circuit and logic circuit to determine proper operation. An operational amplifier is used that can both source and sink current to simulate the operation of the battery. A battery low signal can be generated using the simulated battery test device to test a battery charging circuit and logic circuit in a battery low condition. In addition, a battery open signal can be generated to test the battery charging and logic circuit in a battery open condition. Charging currents are detected to determine if currents fall within an acceptable range.