SYSTEM AND METHOD FOR DETERMINING A DEFECT ON A SURFACE OF AN OBJECT
- 申请公布号：
- WO2014098202(A1)
- 申请号：
- WO2013JP84173
- 申请日期：
- 2013.12.13
- 申请公布日期：
- 2014.06.26
- 申请人：
- MITSUBISHI ELECTRIC CORPORATION
- 发明人：
- KNIAZEV, ANDREI
- 分类号：
- G06T7/00;G06T7/60
- 主分类号：
- G06T7/00
- 摘要：
- A method determines a defect on a surface of an object. A symmetric representation of at least part of the object is generated and a pair of unmatched areas between the surface of the object and a surface of the symmetric representation is determined. Next, the defect on the surface of the object is determined based on the pair of unmatched areas.
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